Title :
Comparison of PSD of HRV and DFA of EEG during general anesthesia
Author :
Ye, Soo-young ; Jeong, Do-Un
Author_Institution :
Dept. of Mechtronics, Dongseo Univ., Busan, South Korea
fDate :
Nov. 30 2010-Dec. 2 2010
Abstract :
To investigate the effect of PSD of HRV and DFA of EEG on autonomic nervous system activity and central nervous activity during general anesthesia. Fifteen ASA physical status I and II patients scheduled for TAH(Total Abdominal Hysterectomy). Patients were received to sadation with sevoflurane. The PSD(power spectrum density) of HRV(heart rate variability) and DFA(detrended fluctuation analysis) of EEG were used for the analysis. These values were measured at the preanesthetic period, intubation, operation, extubation and post-anesthesia with sedation. PSD and DFA of the ECG and EEG data were assessed to quantify the frequency band and the fractal and self-similarity properties of EEG signal. At intubation stage, high-frequency(HF) power (HF 0.15-0.4 Hz) and low-frequency(LF) power (LF 0.04 -0.15 Hz) both decreased compared with preanesthesia. But detrended fluctuation analysis(DFA) was increased compared with preanesthesia. At postanesthesia, HF, LF and DFA returned to preanesthesia. In this paper, we aimed to estimate the depth of anesthesia and review the correlation PSD of HRV and DFA of EEG during general anesthesia to estimate depth of anesthesia.
Keywords :
electrocardiography; electroencephalography; medical signal processing; ECG signal; EEG signal; autonomic nervous system activity; central nervous activity; detrended fluctuation analysis; electrocardiography; electroencephalography; extubation period; general anesthesia; heart rate variability; intubation period; post-anesthesia period; power spectrum density; pre-anesthetic period; total abdominal hysterectomy; Anesthesia; Correlation; Doped fiber amplifiers; Electroencephalography; Hafnium; Heart rate variability; Indexes; Anesthesia; DFA; EEG; PSD; component;
Conference_Titel :
Computer Sciences and Convergence Information Technology (ICCIT), 2010 5th International Conference on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-8567-3
Electronic_ISBN :
978-89-88678-30-5
DOI :
10.1109/ICCIT.2010.5711118