DocumentCode :
2482881
Title :
Temperature measurement of low-current discharges based on N2 (2+) molecular emission spectra
Author :
Xiao, A. ; Rowland, S.M. ; Whitehead, J.C. ; Tu, X.
Author_Institution :
Sch. of Electron. & Electr. Eng., Univ. of Manchester, Manchester, UK
fYear :
2012
fDate :
14-17 Oct. 2012
Firstpage :
191
Lastpage :
194
Abstract :
A series of experiments has been carried out to determine the gas temperature of low current (<; 5 mA) discharges in ambient conditions. The measurement is based on optical emission spectroscopy (OES) analysis using N2 (2+) molecular emission spectra of the air discharge. Temperatures of discharges of different current levels with various arc lengths have been measured and analysis has been carried out to determine the relationships between discharge temperatures, discharge currents and arc lengths. Between lengths of 2 and 6 mm, and currents of 3 and 4.5 mA, predictable temperature variations were found between 1200 and 1800 k.
Keywords :
arcs (electric); plasma diagnostics; plasma temperature; plasma transport processes; temperature measurement; N2 (2+) molecular emission spectra; OES analysis; air discharge; ambient conditions; arc lengths; current levels; discharge currents; discharge temperatures; gas temperature; low-current discharges; optical emission spectroscopy analysis; temperature measurement; Current measurement; Discharges (electric); Fault diagnosis; Plasma temperature; Resistors; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2012 Annual Report Conference on
Conference_Location :
Montreal, QC
ISSN :
0084-9162
Print_ISBN :
978-1-4673-1253-0
Electronic_ISBN :
0084-9162
Type :
conf
DOI :
10.1109/CEIDP.2012.6378753
Filename :
6378753
Link To Document :
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