DocumentCode :
2483069
Title :
Design, fabrication, and characterization of BESOI-accelerometer based on photonic band gap effect
Author :
Andò, B. ; Baglio, S. ; Trigona, C.
Author_Institution :
Dipt. di Ing. Elettr. Elettron. e Inf. (DIEEI), Univ. degli Studi di Catania, Catania, Italy
fYear :
2012
fDate :
13-16 May 2012
Firstpage :
2309
Lastpage :
2312
Abstract :
This paper reports numerical and experimental investigation on a (bulk and etch silicon on insulator) BESOI optoelectromechanical system, realized using a multilayer, metal-dielectric photonic band gap (PBG) structure. Variations in the reflectance spectrum are related to the displacement of the proof mass induced by an external acceleration. The properties of PBG transparent metals allow to obtain a sharp change in the output signal even for very small changes of the air gap and therefore of the relative positions of the proof mass, due to the high refractive difference of indexes. The MEMS is represented by a suspended squared shape mass supported by a four crab-leg beams and the central part is used as active optical area to normally focus the light beam. The advantages of silicon micromachining combined with PBG properties have been addressed and compared with our previously work. The sensor proposed here has been first analytically and numerically studied by using CoventorWare, then the device has been fabricated and an experimental campaign has been performed.
Keywords :
accelerometers; air gaps; micromachining; micromechanical devices; photonic band gap; silicon-on-insulator; BESOI optoelectromechanical system; BESOI-accelerometer; CoventorWare; MEMS; PBG structure; active optical area; air gap; four crab-leg beams; high refractive difference; indexes; metal-dielectric photonic band gap structure; multilayer structure; silicon micromachining; Metals; Optical device fabrication; Optical diffraction; Optical films; Optical reflection; Optical sensors; BESOI technology; MOEMS; photonic bandgap materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
Conference_Location :
Graz
ISSN :
1091-5281
Print_ISBN :
978-1-4577-1773-4
Type :
conf
DOI :
10.1109/I2MTC.2012.6229537
Filename :
6229537
Link To Document :
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