DocumentCode
2484012
Title
Contourlet based distance measurement to improve fingerprint identification accuracy
Author
Omidyeganeh, M. ; Javadtalab, A. ; Ghaemmaghami, S. ; Shirmohammadi, S.
Author_Institution
Dept. of Electr. Eng., Sharif Univ. of Technol., Tehran, Iran
fYear
2012
fDate
13-16 May 2012
Firstpage
371
Lastpage
375
Abstract
In this paper, Kullback-Leibler Distance (KLD) is employed to measure the dissimilarity between marginal statistical features of contourlet transform to fingerprint identification. Conourlet transform is a non separable two dimensional transform which can well capture the geometry of edges in the images which convey important information for the human visual system (HVS). Here, marginal statistics of each transform subband are modeled by a Generalized Gaussian Density (GGD) model and the GGD parameters-α and β- are granted as the extracted features from the corresponding subbands and the fingerprint recognition is done based on k-NN classifier employing Kullback-Leibler Distance (KLD) measure. The fingerprint recognition results confirm the high efficiency of the proposed system comparing with the state of the art methods.
Keywords
Gaussian processes; computerised instrumentation; distance measurement; feature extraction; fingerprint identification; geometry; learning (artificial intelligence); neural nets; pattern classification; GGD model; HVS; KLD; Kullback-Leibler distance; contourlet transform; dissimilarity measurement; distance measurement; feature extraction; fingerprint identification; fingerprint recognition; generalized Gaussian density model; human visual system; image edge geometry; k-NN classifier; marginal statistical feature; nonseparable two dimensional transform; Databases; Error analysis; Feature extraction; Fingerprint recognition; Image matching; Wavelet transforms; Fingerprint recognition; K-NN Classifier; Kullback-Leibler distance measure; contourlet transform; generalized Gaussian density;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
Conference_Location
Graz
ISSN
1091-5281
Print_ISBN
978-1-4577-1773-4
Type
conf
DOI
10.1109/I2MTC.2012.6229585
Filename
6229585
Link To Document