• DocumentCode
    2484012
  • Title

    Contourlet based distance measurement to improve fingerprint identification accuracy

  • Author

    Omidyeganeh, M. ; Javadtalab, A. ; Ghaemmaghami, S. ; Shirmohammadi, S.

  • Author_Institution
    Dept. of Electr. Eng., Sharif Univ. of Technol., Tehran, Iran
  • fYear
    2012
  • fDate
    13-16 May 2012
  • Firstpage
    371
  • Lastpage
    375
  • Abstract
    In this paper, Kullback-Leibler Distance (KLD) is employed to measure the dissimilarity between marginal statistical features of contourlet transform to fingerprint identification. Conourlet transform is a non separable two dimensional transform which can well capture the geometry of edges in the images which convey important information for the human visual system (HVS). Here, marginal statistics of each transform subband are modeled by a Generalized Gaussian Density (GGD) model and the GGD parameters-α and β- are granted as the extracted features from the corresponding subbands and the fingerprint recognition is done based on k-NN classifier employing Kullback-Leibler Distance (KLD) measure. The fingerprint recognition results confirm the high efficiency of the proposed system comparing with the state of the art methods.
  • Keywords
    Gaussian processes; computerised instrumentation; distance measurement; feature extraction; fingerprint identification; geometry; learning (artificial intelligence); neural nets; pattern classification; GGD model; HVS; KLD; Kullback-Leibler distance; contourlet transform; dissimilarity measurement; distance measurement; feature extraction; fingerprint identification; fingerprint recognition; generalized Gaussian density model; human visual system; image edge geometry; k-NN classifier; marginal statistical feature; nonseparable two dimensional transform; Databases; Error analysis; Feature extraction; Fingerprint recognition; Image matching; Wavelet transforms; Fingerprint recognition; K-NN Classifier; Kullback-Leibler distance measure; contourlet transform; generalized Gaussian density;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
  • Conference_Location
    Graz
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4577-1773-4
  • Type

    conf

  • DOI
    10.1109/I2MTC.2012.6229585
  • Filename
    6229585