• DocumentCode
    2484103
  • Title

    A reduced model solution for the chemical master equation arising in stochastic analyses of biological networks

  • Author

    Munsky, Brian ; Khammash, Mustafa

  • Author_Institution
    Dept. of Mech. & Environ. Eng., California Univ., Santa Barbara, CA
  • fYear
    2006
  • fDate
    13-15 Dec. 2006
  • Firstpage
    25
  • Lastpage
    30
  • Abstract
    This article introduces the observability aggregated finite state projection (OAFSP) method for use in the stochastic analysis of biological systems. The small chemical populations of such systems have probability distributions that evolve according to a set of linear, time-invariant, ordinary differential equations known as the chemical master equation (CME). The original FSP algorithm directly approximates the full CME solution to within a prespecified error. However, one may be interested only in certain portions of the distribution or certain statistical quantities such as mean or variance, and the full FSP method may provide an excess of information. In these cases, one can define a linear output signal and extract only the reachable and observable regions from the full distribution state space. The unobservable regions of the distribution can be aggregated with no accuracy loss but with less computational cost. This paper presents the resulting OAFSP algorithm and illustrates its benefits on a simple chemical reaction
  • Keywords
    biology computing; chemistry computing; probability; stochastic processes; biological network; chemical master equation; observability aggregated finite state projection; ordinary differential equation; probability distribution; reduced model solution; stochastic analysis; Biochemical analysis; Biological system modeling; Biological systems; Chemical analysis; Data mining; Differential equations; Observability; Probability distribution; Stochastic processes; Stochastic systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 2006 45th IEEE Conference on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    1-4244-0171-2
  • Type

    conf

  • DOI
    10.1109/CDC.2006.377251
  • Filename
    4178046