Title :
Variability of single event-related brain potentials
Author :
Möcks, Joachim ; Gasser, Theo ; Tuan, Pham Dinh
Author_Institution :
Heidelberg Univ., West Germany
Abstract :
Electrical responses of the brain to stimuli can be conceived as deterministic low-amplitude signals embedded in colored noise. Subjects are repeatedly stimulated to extract the brain´s response by averaging. The authors address the issue that single responses may vary from trial-to-trial. Three statistical tests are defined and their theoretical properties are given. Simulations based on real data demonstrate the tests´ empirical validity and their differential sensitivity to different types of signal variation. A real data application shows that substantial variations were present even in a simple experimental setting.<>
Keywords :
bioelectric potentials; brain; statistical analysis; colored noise; deterministic low-amplitude signals; differential sensitivity; electrical responses; real data application; single event-related brain potentials; statistical tests; Background noise; Brain modeling; Colored noise; Data mining; Psychology; Scalp; Signal to noise ratio; Smoothing methods; Statistical analysis; Testing;
Conference_Titel :
Circuits and Systems, 1988., IEEE International Symposium on
Conference_Location :
Espoo, Finland
DOI :
10.1109/ISCAS.1988.15366