• DocumentCode
    2484454
  • Title

    Dielectric properties of Boron Nitride and silica epoxy composites

  • Author

    Couderc, H. ; Preda, I. ; Fréchette, M. ; Savoie, S. ; Reading, M. ; Vaughan, A.S. ; Castellon, J.

  • Author_Institution
    Inst. de Rech. d´´Hydro-Quebec (IREQ), Varennes, QC, Canada
  • fYear
    2012
  • fDate
    14-17 Oct. 2012
  • Firstpage
    511
  • Lastpage
    516
  • Abstract
    Epoxies are widely used materials, especially in high voltage insulation for its mechanical and dielectric properties. Boron Nitride is an attractive filler because of its high insulating properties associated with a high thermal conductivity. Nanometric Silica used as filler is actually widely studied in the literature and enhancement of dielectric breakdown and insulating properties has been shown. Using a combination of these two fillers in an epoxy matrix may produce a new material with improved properties. Samples containing only micrometric filler (Boron Nitride), only nanometric filler (Silica) and both fillers were prepared by gravity moulding. A pure epoxy sample was also prepared to quantify the enhancement properties. Broadband Dielectric Spectroscopy was used to study the influence of nanoparticles on the relaxation mechanisms in the composites. An additional relaxation peak was highlighted for samples containing nanosilica between the local β relaxation, associated with crankshaft motions of the hydroxylether groups, and the main α relaxation, corresponding to glass transition cooperative movements. This relaxation phenomenon was found to be associated with the water bounded at the surface of the silica particles. Further relaxation investigation will be performed to clarify the influence of water, its state and its role.
  • Keywords
    composite insulating materials; dielectric materials; dielectric relaxation; electric breakdown; elemental semiconductors; epoxy insulation; filled polymers; glass transition; nanocomposites; nanoparticles; oxygen compounds; shafts; silicon; silicon compounds; thermal conductivity; α relaxation mechanism; β relaxation mechanism; SiO2; broadband dielectric spectroscopy; crankshaft motion; dielectric breakdown; dielectric property; epoxy composite; epoxy matrix; glass transition; gravity moulding; hydroxylether group; mechanical property; micrometric filler; nanometric filler; nanometric silica; nanoparticle; nanosilica; thermal conductivity; voltage insulation; Boron; Cooling; Dielectrics; Glass; Heating; Indexes; Silicon compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena (CEIDP), 2012 Annual Report Conference on
  • Conference_Location
    Montreal, QC
  • ISSN
    0084-9162
  • Print_ISBN
    978-1-4673-1253-0
  • Electronic_ISBN
    0084-9162
  • Type

    conf

  • DOI
    10.1109/CEIDP.2012.6378832
  • Filename
    6378832