Title :
AC-DC difference of millivolt thermal standards
Author_Institution :
Ballantine Labs. Inc., Cedar Knolls, NJ, USA
Abstract :
The error sources of AC-DC differences of millivolt thermal standards-micropotentiometers (/spl mu/pot´s)-and the step down calibrations of /spl mu/pot´s from 20 Hz to 1 MHz are analyzed. The new step down method for sub-mV ranges significantly reduces the /spl mu/pot´s uncertainty.
Keywords :
calibration; measurement errors; measurement standards; potentiometers; thin film resistors; voltage measurement; 0.5 to 5 mV; 20 Hz to 1 MHz; AC-DC difference; disk resistors; error sources; micropotentiometers; millivolt thermal standards; primary standard; skin effect; step down calibrations; sub-mV ranges; thermal voltage converters; uncertainty reduction; Calibration; Current measurement; Dielectric losses; Frequency; Impedance; Resistors; Skin effect; Tellurium; Testing; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location :
Braunschweig, Germany
Print_ISBN :
0-7803-3376-4
DOI :
10.1109/CPEM.1996.547358
