• DocumentCode
    2484725
  • Title

    Bi-Watermarking Algorithm Based on Contourlet

  • Author

    Yong, Shihua ; Wang, Xiaoli ; Ma, Xiaohu

  • Author_Institution
    Sch. of Comput. Sci. & Technol., Soochow Univ., Suzhou, China
  • fYear
    2010
  • fDate
    22-23 May 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A bi-watermarking algorithm basing on Contourlet transform is proposed in this paper. The algorithm adopts different methods to insert watermark into the low frequency and high frequency of the host image respectively. Firstly, perform Contourlet transform to the host image, then choose the low frequency to embed the watermark combined with Singular Value Decomposition(SVD), finally, putting coefficients into one group with the same coordinate in each finest directional subband, selecting the coefficients with the richest texture from each group as the coefficients to embed watermark. Therefore, watermark can be embedded into significant region as well as highly textured region of the host image. The method makes full use of the advantages of the dual watermarking in different subbands to resist different attacks, so the robustness of the algorithm can be improved. Experimental results show that the proposed algorithm is invisibility and is very robust to many image attacks.
  • Keywords
    image texture; security of data; singular value decomposition; watermarking; wavelet transforms; Bi-watermarking algorithm; Contourlet transform; SVD; high frequency subband; image attacks; image texture; low frequency subband; singular value decomposition; Circuit faults; Clocks; Computer errors; Data security; Fault detection; Frequency; Hardware; Logic devices; Registers; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    e-Business and Information System Security (EBISS), 2010 2nd International Conference on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-5893-6
  • Electronic_ISBN
    978-1-4244-5895-0
  • Type

    conf

  • DOI
    10.1109/EBISS.2010.5473580
  • Filename
    5473580