DocumentCode
2484751
Title
The chemical analysis and replication of polydimethylsiloxane by-products located within electrical trees
Author
Freebody, N.A. ; Vaughan, A.S. ; Lunt, P.J.B. ; Flavell, W.R. ; Wincott, P.L.
Author_Institution
Sch. of Electron. & Comput. Sci., Univ. of Southampton, Southampton, UK
fYear
2012
fDate
14-17 Oct. 2012
Firstpage
585
Lastpage
588
Abstract
We present a spectroscopic study of electrical trees grown in polydimethylesiloxane (PDMS) rubber. Electrical trees were grown at a range of voltages and allowed to propagate throughout the material. Breakdown and tree channels were exposed using cryogenic microtoming. Raman microprobe spectroscopy (RMS), Fourier Transform Infrared (FTIR), and X-ray Photoelectron Spectroscopy (XPS) were applied in order to obtain a detailed spectroscopic analysis of electrical treeing and breakdown in PDMS rubber. For comparison, a selection of liquid systems including PDMS oil, dodecylbenzene (DDB) and dodecane (DD) were subjected to ageing via electrical discharges between two electrodes. The debris subsequently formed was subjected to spectroscopic analysis as before. Results are discussed in comparison to previously published results involving electrical treeing and corona discharge experiments in polyethylene (PE) and PDMS rubber.
Keywords
Fourier transform spectroscopy; Raman spectroscopy; chemical analysis; corona; infrared spectroscopy; trees (electrical); DD; DDB; FTIR spectroscopy; Fourier transform infrared spectroscopy; PDMS oil; PDMS rubber; PE rubber; RMS; Raman microprobe spectroscopy; X-ray photoelectron spectroscopy; XPS; chemical analysis; corona discharge experiment; cryogenic microtoming; dodecane; dodecylbenzene; electrical discharges; electrical trees; liquid system selection; polydimethylesiloxane rubber; polydimethylsiloxane by-products; polyethylene rubber; spectroscopic analysis; spectroscopic study; tree channel; Aging; Chemicals; Liquids; Plastics; Sparks; Vegetation;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena (CEIDP), 2012 Annual Report Conference on
Conference_Location
Montreal, QC
ISSN
0084-9162
Print_ISBN
978-1-4673-1253-0
Electronic_ISBN
0084-9162
Type
conf
DOI
10.1109/CEIDP.2012.6378848
Filename
6378848
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