DocumentCode
2484913
Title
Femtosecond parametric sources
Author
van Driel, H.M.
Author_Institution
Dept. of Phys., Ontario Laser & Lightwave Res. Center, Toronto, Ont., Canada
fYear
1993
fDate
15-18 Nov 1993
Firstpage
789
Abstract
Summary form only given. The Kerr-lens, modelocked Ti:sapphire laser has revolutionized the field of ultrafast spectroscopy by providing a stable source of <100 fs pulses with average power of more than 1 W in the range 720-950 nm. Recently we showed that the low noise and high peak and average power of this source make it ideal for synchronously pumping a KTP-based optical parametric oscillator (OPO). In order to have a wide tuning range our system employs non-collinear but critical (angle) phase-matching in 0.8-2 mm thick crystals. We have now experimentally and theoretically characterized the OPO and will discuss how Poynting vector walk-off, group velocity dispersion, crystal length, and self-phase modulation determine the ultimate performance of such ultrashort pulse parametric systems based on KTP or LBO
Keywords
high-speed optical techniques; light sources; optical dispersion; optical materials; optical modulation; optical parametric oscillators; optical pumping; phase modulation; potassium compounds; vectors; 0.8 to 2 mm; 1 W; 100 fs; 720 to 950 nm; KTP-based optical parametric oscillator; KTiOPO4; Kerr-lens modelocked Ti:sapphire laser; Poynting vector walk-off; average power; critical angle phase-matching; crystal length; femtosecond parametric sources; fs pulses; group velocity dispersion; high peak power; low noise; noncollinear phase matching; self-phase modulation; stable source; synchronously pumping; ultrafast spectroscopy; ultrashort pulse parametric systems; wide tuning range; Laser modes; Laser noise; Laser stability; Nonlinear optics; Optical noise; Optical pulses; Power lasers; Pulse modulation; Spectroscopy; Ultrafast optics;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society Annual Meeting, 1993. LEOS '93 Conference Proceedings. IEEE
Conference_Location
San Jose, CA
Print_ISBN
0-7803-1263-5
Type
conf
DOI
10.1109/LEOS.1993.379428
Filename
379428
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