DocumentCode
2484985
Title
Time dependence of spacer charging in SF6 under DC stress
Author
Schueller, Michael ; Straumann, Ueli ; Franck, Christian M.
Author_Institution
Power Syst. & High Voltage Labs., ETH Zurich, Zurich, Switzerland
fYear
2012
fDate
14-17 Oct. 2012
Firstpage
629
Lastpage
632
Abstract
As gas insulated DC transmission systems unite the advantages of space saving installation and big transmission capacity, this technology will become essential soon. The main problem in operation with respect to insulation seems to be identified today, which is charge accumulation on the surface of the insulators, so called spacers. These trapped charges can cause a reduction of dielectric strength and can lead to a breakdown, especially at polarity reversals and overvoltages. For experiments, a full encapsulated test setup was constructed. Test voltages up to 700 kV DC and a pressure up to 8 bar SF6 are possible. The main component of this setup is a 3 axis fully automated robotic handle system for moving the probe over the test samples inside the encapsulation. So the surface charge can be measured at all positions at the sample surface. The time dependence of the charging mechanism till the saturated state is of big interest. Thus the experiments presented in this paper deal with the influence of the measurement itself on the charging process.
Keywords
HVDC power transmission; gas insulated transmission lines; DC stress; charge accumulation; dielectric strength reduction; full encapsulated test setup; fully automated robotic handle system; gas insulated DC transmission systems; polarity reversals; space saving installation; spacer charging; surface charge; test samples; transmission capacity; trapped charges; voltage 700 kV; Charge measurement; Electrodes; Probes; Sulfur hexafluoride; Surface charging; Surface treatment; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena (CEIDP), 2012 Annual Report Conference on
Conference_Location
Montreal, QC
ISSN
0084-9162
Print_ISBN
978-1-4673-1253-0
Electronic_ISBN
0084-9162
Type
conf
DOI
10.1109/CEIDP.2012.6378859
Filename
6378859
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