• DocumentCode
    2485378
  • Title

    Mechanism and application of refractive index increase induced in fluorinated polyimide by ion irradiation

  • Author

    Arai, Y. ; Ohki, Y. ; Saito, K. ; Nishikawa, H.

  • Author_Institution
    Dept. of Electr. Eng. & Biosci., Waseda Univ., Tokyo, Japan
  • fYear
    2012
  • fDate
    14-17 Oct. 2012
  • Firstpage
    705
  • Lastpage
    708
  • Abstract
    This paper reports a result carried out in order to clarify the applicability of ion irradiation effects to polymer materials used for optical waveguides. We irradiated 950-keV He+ ions or 1.0-MeV H+ ions to a fluorinated polyimide film to a fluence between 1 × 1014 and 7 × 1016 cm-2, and the film surface was scanned by a profilometer. The depth of a dent induced by the irradiation increases with an increase in the fluence. From the depth of the dent, the projected range of the He+ ions, and the Lorentz-Lorenz equation, the refractive index of the ion-irradiated region was found to increase by 2.9 %. This value agrees with the increment in refractive index measured by spectroscopic ellipsometry, which also increases as the fluence increases. Furthermore, the increment in refractive index, 0.21 %, induced by the irradiation of H+ ions to the fluence of 1 × 1015 cm-2 is comparable to the value, 0.35 %, observed when H+ ions of a similar fluence were irradiated to SiO2 glass. Therefore, it is natural to assume that the ion irradiation to the polymer can be a good tool to fabricate a high-performance polymer-based optical waveguide.
  • Keywords
    optical waveguides; polymer films; refractive index; Lorentz-Lorenz equation; electron volt energy 950 MeV; fluorinated polyimide; fluorinated polyimide film; high-performance polymer-based optical waveguide; ion irradiation effects; ion-irradiated region; polymer materials; profilometer; refractive index; spectroscopic ellipsometry; Ions; Optical waveguides; Polyimides; Protons; Radiation effects; Refractive index;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena (CEIDP), 2012 Annual Report Conference on
  • Conference_Location
    Montreal, QC
  • ISSN
    0084-9162
  • Print_ISBN
    978-1-4673-1253-0
  • Electronic_ISBN
    0084-9162
  • Type

    conf

  • DOI
    10.1109/CEIDP.2012.6378878
  • Filename
    6378878