• DocumentCode
    2485440
  • Title

    Information leakage from cryptographic hardware via common-mode current

  • Author

    Hayashi, Yu-ichi ; Sugawara, Takeshi ; Kayano, Yoshiki ; Homma, Naofumi ; Mizuki, Takaaki ; Satoh, Akashi ; Aoki, Takafumi ; Minegishi, Shigeki ; Sone, Hideaki ; Inoue, Hiroshi

  • Author_Institution
    Tohoku Univ., Sendai, Japan
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    109
  • Lastpage
    114
  • Abstract
    Recently, it has been known that electromagnetic radiation from electrical device leaks internal information. That is, electromagnetic radiation contains information. Especially, it causes serious problem for cryptographic modules if electromagnetic radiation contains secret information. Therefore many studies have been made on power/electromagnetic analysis attacks, which extract secret keys from cryptographic modules by analyzing waveforms of currents, voltage or electromagnetic field. The attacks assume that the waveforms should contain the information leakage in some way. However, there are few studies discussing about “mechanisms” of the information leakage via electromagnetic field. In this paper, we will give the leakage model caused by common-mode currents, which are one of dominant factors of radiation. If the common-mode currents contain the secret information, it might be possible to obtain the information from far field. In order to verify the leakage model, we implement cryptographic hardware on an FPGA board, and reveal the secret information from common-mode currents measured by using EMC measurement techniques.
  • Keywords
    cryptography; electromagnetic compatibility; electromagnetic waves; field programmable gate arrays; EMC measurement technique; FPGA board; common-mode current; cryptographic hardware; electrical device; electromagnetic field radiation; information leakage; power-electromagnetic analysis; Cryptography; Current measurement; Data mining; Hardware; Power cables; Transient analysis; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
  • Conference_Location
    Fort Lauderdale, FL
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4244-6305-3
  • Type

    conf

  • DOI
    10.1109/ISEMC.2010.5711256
  • Filename
    5711256