DocumentCode
2485615
Title
Periodic piecewise linear excitation for ADC testing
Author
Ong, Tat Chern ; Tee, Min Tong ; Kuang, Ye Chow ; Ooi, Melanie Po-Leen ; Demidenko, Serge
Author_Institution
Monash Univ. Sunway Campus, Bandar Sunway, Malaysia
fYear
2012
fDate
13-16 May 2012
Firstpage
2285
Lastpage
2290
Abstract
Piecewise linear waveforms have the advantage of being accurate and easy to generate while employing relatively simple circuitry. This make it attractive to consider piecewise linear functions as test signals for high performance ADC testing. In this paper a new set of periodic piecewise linear basis functions are presented and evaluated to assess the convergence quality, jitter detection, incoherent sampling response, spectral analysis, and phase shift sensitivity.
Keywords
analogue-digital conversion; jitter; phase shifters; piecewise linear techniques; convergence quality; high performance ADC testing; incoherent sampling response; jitter detection; phase shift sensitivity; piecewise linear functions; spectral analysis; test signals; Convergence; Harmonic distortion; Jitter; Sensitivity; Testing; Time frequency analysis; ADC testing; Piecewise linear waveform; basis function;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
Conference_Location
Graz
ISSN
1091-5281
Print_ISBN
978-1-4577-1773-4
Type
conf
DOI
10.1109/I2MTC.2012.6229680
Filename
6229680
Link To Document