• DocumentCode
    2485615
  • Title

    Periodic piecewise linear excitation for ADC testing

  • Author

    Ong, Tat Chern ; Tee, Min Tong ; Kuang, Ye Chow ; Ooi, Melanie Po-Leen ; Demidenko, Serge

  • Author_Institution
    Monash Univ. Sunway Campus, Bandar Sunway, Malaysia
  • fYear
    2012
  • fDate
    13-16 May 2012
  • Firstpage
    2285
  • Lastpage
    2290
  • Abstract
    Piecewise linear waveforms have the advantage of being accurate and easy to generate while employing relatively simple circuitry. This make it attractive to consider piecewise linear functions as test signals for high performance ADC testing. In this paper a new set of periodic piecewise linear basis functions are presented and evaluated to assess the convergence quality, jitter detection, incoherent sampling response, spectral analysis, and phase shift sensitivity.
  • Keywords
    analogue-digital conversion; jitter; phase shifters; piecewise linear techniques; convergence quality; high performance ADC testing; incoherent sampling response; jitter detection; phase shift sensitivity; piecewise linear functions; spectral analysis; test signals; Convergence; Harmonic distortion; Jitter; Sensitivity; Testing; Time frequency analysis; ADC testing; Piecewise linear waveform; basis function;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
  • Conference_Location
    Graz
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4577-1773-4
  • Type

    conf

  • DOI
    10.1109/I2MTC.2012.6229680
  • Filename
    6229680