DocumentCode
2485879
Title
Development of a reflectance photoplethysmographic sensor used for the assessment of free flap perfusion
Author
Zaman, T. ; Kyriacou, P.A. ; Pal, S.K.
Author_Institution
Sch. of Eng. & Math. Sci., City Univ., London, UK
fYear
2011
fDate
Aug. 30 2011-Sept. 3 2011
Firstpage
4006
Lastpage
4009
Abstract
Monitoring of free flap perfusion and early identification of flap failure is an indispensable prerequisite for flap salvage. Although many methods of free flap monitoring are available, there is still no single reliable continuous non-invasive perfusion monitoring technique which will also assist in the early recognition of flap failure. In order to overcome the current technological limitations, we have developed a multi-wavelength photoplethysmographic (PPG) sensor and processing system to systematically investigate the perfusion mechanism in flaps used in reconstructive plastic microsurgery. The new prototype reflectance photoplethysmographic sensor was evaluated on three anaesthetized patients undergoing elective breast reconstructive (Deep Inferior Epigastric Perforator Flap) surgery. PPG signals were successfully obtained pre-operatively, intra-operatively and post-operatively. These preliminary results suggest that a PPG sensor may be a suitable method for evaluating the perfusion of free flap.
Keywords
cancer; haemorheology; patient monitoring; photoplethysmography; surgery; PPG sensor; deep inferior epigastric perforator flap surgery; elective breast reconstructive surgery; flap failure; flap salvage; free flap monitoring; free flap perfusion; mastectomy; multiwavelength photoplethysmographic sensor; noninvasive perfusion monitoring; perfusion mechanism; reconstructive plastic microsurgery; reflectance photoplethysmographic sensor; Breast; Clamps; Light emitting diodes; Monitoring; Plastics; Reflectivity; Surgery; Humans; Photoplethysmography; Surgical Flaps; Treatment Failure;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location
Boston, MA
ISSN
1557-170X
Print_ISBN
978-1-4244-4121-1
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2011.6090995
Filename
6090995
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