Title :
Fast calculation of dielectric substrate losses in microwave applications by the FD2TD method using a new formalism
Author :
Buccella, C. ; De Santis, V. ; Feliziani, M. ; Maradei, F.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of L´´Aquila, L´´Aquila, Italy
Abstract :
The paper deals with the electromagnetic characterization of a dielectric substrate by a numerical analysis. The electromagnetic analysis is performed by a frequency-dependent finite difference time domain (FD2TD) method with a new formulation. A multi-pole Debye dispersive relation is used to model frequency-dependent properties of dispersive dielectrics. The proposed method is suitable to predict efficiently substrate dielectric losses in microwave and RF applications.
Keywords :
dielectric losses; finite difference time-domain analysis; microwave devices; substrates; FD2TD method; RF application; dielectric substrate losses; dispersive dielectrics; electromagnetic analysis; electromagnetic characterization; frequency-dependent finite difference time domain method; frequency-dependent properties; microwave applications; multipole Debye dispersive relation; numerical analysis; substrate dielectric losses; Current density; Dielectric losses; Dispersion; Media; Time domain analysis; Transient analysis;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
Conference_Location :
Fort Lauderdale, FL
Print_ISBN :
978-1-4244-6305-3
DOI :
10.1109/ISEMC.2010.5711280
