Title :
Evaluation of semiconductive shields on wet aging performance of solid dielectric insulated power cables
Author_Institution :
Dow Chem. Co., Spring House, PA, USA
Abstract :
In recent years, semiconductive shields research for power cable application has been focusing on improving the smoothness and cleanliness of the conductor shields to enhance the performance of cable life. New crosslinkable semiconductive conductor shield compounds have been tested extensively both in the laboratory and on insulated power cables. A supersmooth class of compounds was produced with new polymer technology and acetylene black, and then used to fabricate a 15kV cable with XLPE insulation. This cable was tested for long term accelerated wet aging conditions and found to exhibit superior life performance relative to a control XLPE cable with typical supersmooth semiconducive shield. Aged cables were also diagnosed and found to exhibit high retained electrical breakdown strength and low dissipation factor, and showed low propensity of any vented tree growth from the conductor shield, indicating the benefit of long cable life performance in comparison to typical supersmooth semiconductive shield cable. In this study, the effect of the semiconductive shield types on the cable aging characteristics will be discussed.
Keywords :
XLPE insulation; ageing; conductors (electric); electric strength; insulator testing; life testing; polymers; power cable insulation; power cable testing; trees (electrical); XLPE cable insulation; acetylene black; cable aging characteristics; conductor shields; crosslinkable semiconductive conductor shield compounds; electrical breakdown strength; long term accelerated wet aging condition testing; low dissipation factor; polymer technology; semiconductive shield evaluation; solid dielectric insulated power cables; supersmooth semiconductive shield cable; vented tree growth; voltage 15 kV; wet aging performance; Aging; Cable insulation; Cable shielding; Conductors; Polymers; Power cables; Viscosity;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2012 Annual Report Conference on
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4673-1253-0
Electronic_ISBN :
0084-9162
DOI :
10.1109/CEIDP.2012.6378906