Title :
Improvements in design of spectra of multisine and binary excitation signals for multi-frequency bioimpedance measurement
Author :
Land, Raul ; Cahill, Brian P. ; Parve, Toomas ; Annus, Paul ; Min, Mart
Author_Institution :
Th. J. Seebeck Dept. of Electron., Tallinn Univ. of Technol., Tallinn, Estonia
fDate :
Aug. 30 2011-Sept. 3 2011
Abstract :
The paper discusses the usability of multi-frequency binary waveforms for broadband excitation in fast measurements of impedance spectrum of biological objects. It is shown that up to 70% of the energy of the amplitude spectrum of such two-level binary signals can be concentrated into the selected separate frequencies. The levels of selected frequency components are controllable in tens and hundreds of times. In this way we can underline the most important frequencies enhancing the corresponding amplitudes in the spectrum of excitation signal. As an implementation example, we consider the impedance spectroscopy in micro-fluidic devices for inline measurement of the conductivity of droplets in segmented flow. We use a thin-walled glass capillary with electrodes contacting the outer surface so that the contactless measurement of conductivity of liquid with biologic cells becomes possible.
Keywords :
biological fluid dynamics; capillarity; drops; electric impedance imaging; microfluidics; binary excitation signals; biologic cells; biological objects; broadband excitation; contactless measurement; design improvements; droplets; impedance spectroscopy; impedance spectrum; inline measurement; liquid conductivity; microfluidic devices; multifrequency binary waveforms; multifrequency bioimpedance measurement; multisine excitation signals; segmented flow; thin-walled glass capillary; two-level binary signals; Capacitance; Electrodes; Frequency measurement; Impedance; Impedance measurement; Microfluidics; Spectroscopy; Dielectric Spectroscopy; Microfluidics; Signal Processing, Computer-Assisted;
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2011.6091003