• DocumentCode
    2486228
  • Title

    Field injection probes for field coupled Electrostatic Discharge sensitivity database of ICs

  • Author

    Li, Zhen ; Xiao, Jiang ; Seol, Byongsu ; Lee, Jongsung ; Pommerenke, David

  • Author_Institution
    Electromagn. Compatibility Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    329
  • Lastpage
    333
  • Abstract
    An ESD (Electrostatic Discharge) sensitivity database gives a guidance in estimating if, for a given ESD scenario and IC location soft-error (e.g., resets) problems are likely to occur or not. This paper reports on the field probes used.
  • Keywords
    electrostatic discharge; integrated circuits; IC location soft-error; field coupled electrostatic discharge sensitivity database; field injection probes; integrated circuit; Databases; Electrostatic discharge; Integrated circuits; Inverters; Magnetic field measurement; Probes; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
  • Conference_Location
    Fort Lauderdale, FL
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4244-6305-3
  • Type

    conf

  • DOI
    10.1109/ISEMC.2010.5711295
  • Filename
    5711295
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2486228