DocumentCode :
2486249
Title :
Dependence of the time- and frequency-domain response of BCI injection probes on the common- mode characteristic impedance of the cable bundle
Author :
McLean, James ; Sutton, Robert
Author_Institution :
TDK R&D Corp., Cedar Park, TX, USA
fYear :
2010
fDate :
25-30 July 2010
Firstpage :
334
Lastpage :
339
Abstract :
The common-mode characteristic impedance of a typical cable bundle has been suggested to be approximately 150 Ohms. However, standard test fixtures for BCI probes employ 50 Ohm coaxial ports. Here a representative injection probe (transformer) intended for bulk current injection applications is characterized experimentally in the frequency domain using a 2-port vector network analyzer and a standard (50 Ohm) test fixture as described in the IEC 61000-4-6 standard. The full 3-port scattering representation of the probe in the test fixture is then de-embedded and renormalized such that the coaxial ports of the test fixture are changed to 150 Ohms. The time-domain step response of the representative transformer is then computed from renormalized frequency-domain scattering matrix. It is seen that changing the impedance level from 50 Ohms to 150 Ohms significantly alters both the frequency and time domain performance of the transformer. Thus, the standard test fixture does not accurately predict the frequency- and time-domain performance of a typical BCI transformer. It is shown that the dependence of performance on port impedance can, to some extent, be anticipated by examining the equivalent network for the transformer.
Keywords :
cables (electric); electromagnetic compatibility; impedance matching; network analysers; renormalisation; 2-port vector network analyzer; BCI injection probes; bulk current injection; cable bundle; common-mode characteristic impedance; frequency-domain response; renormalized frequency-domain scattering matrix; time-domain response; Fixtures; Frequency domain analysis; Impedance; Power transmission lines; Probes; Scattering; Transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
Conference_Location :
Fort Lauderdale, FL
ISSN :
2158-110X
Print_ISBN :
978-1-4244-6305-3
Type :
conf
DOI :
10.1109/ISEMC.2010.5711296
Filename :
5711296
Link To Document :
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