DocumentCode :
2486454
Title :
An electromagnetics-based parallel transient simulator of linear complexity for the analysis of very large-scale integrated circuits and packages
Author :
Chen, Duo ; Jiao, Dan
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear :
2010
fDate :
25-30 July 2010
Firstpage :
396
Lastpage :
400
Abstract :
A parallel transient electromagnetic simulator of linear complexity and linear speedup is developed to simulate very large-scale integrated circuits and packages from DC to very high frequencies. In this simulator, through suitable basis functions and linear algebraic techniques, we directly and rigorously decompose the original 3-D system matrix into multiple 1-D matrices with negligible computational overhead. Each one-dimensional matrix is made tridiagonal, and hence can be solved readily in linear complexity. We then achieve an almost embarrassingly parallel implementation of the linear-complexity electromagnetic solver with a low communication-to-computation ratio. Numerical experiments on very large-scale integrated circuits and packages have demonstrated superior performance and linear speedup of the proposed parallel transient simulator. It successfully simulates a large-scale combined die-package system from a real product, which involves more than 3.5 billion unknowns, in fast CPU run time.
Keywords :
VLSI; electromagnetism; integrated circuit packaging; electromagnetics based parallel transient simulator; linear complexity; linear speedup; multiple 1D matrices; packages; very large-scale integrated circuits; Complexity theory; Computational modeling; Electromagnetics; Finite element methods; Integrated circuit modeling; Matrix decomposition; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
Conference_Location :
Fort Lauderdale, FL
ISSN :
2158-110X
Print_ISBN :
978-1-4244-6305-3
Type :
conf
DOI :
10.1109/ISEMC.2010.5711307
Filename :
5711307
Link To Document :
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