DocumentCode :
2486841
Title :
Reusing a System Testing Process Using with a Model
Author :
Furuta, Hirohisa ; Ishihara, Akira ; Yamaoka, Takayuki
Author_Institution :
Mitsubishi Electr. Corp., Hyogo
fYear :
2006
fDate :
20-22 Sept. 2006
Firstpage :
1317
Lastpage :
1320
Abstract :
In this paper, we proposed an approach to permit the development of a testing platform in parallel with application development by accumulating knowledge of a testing platform developed in the past. First, we define a meta-model called the system testing development platform, and describe how to accumulate a testing platform. Then, we show how to find an appropriate testing platform. This helps system architects or application developers get information about testing platforms they are working on. Last, we explain the creation of template testing codes that help application developers concentrate on developing test data.
Keywords :
program testing; software development management; software reusability; metamodel; system testing development platform; system testing process; template testing code; test data development; Application software; Computer architecture; Middleware; Programming; Software systems; Software testing; System analysis and design; System testing; Technological innovation; Unified modeling language;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Emerging Technologies and Factory Automation, 2006. ETFA '06. IEEE Conference on
Conference_Location :
Prague
Print_ISBN :
0-7803-9758-4
Type :
conf
DOI :
10.1109/ETFA.2006.355385
Filename :
4178218
Link To Document :
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