Title :
Achieving network on chip fault tolerance by adaptive remapping
Author :
Ababei, Cristinel ; Katti, Rajendra
Author_Institution :
Electr. & Comput. Eng. Dept., North Dakota State Univ., Fargo, ND, USA
Abstract :
This paper investigates achieving fault tolerance by adaptive remapping in the context of networks on chip. The problem of dynamic application remapping is formulated and an efficient algorithm is proposed to address single and multiple PE failures. The new algorithm can be used to dynamically react and recover from PE failures in order to maintain system functionality. The quality of results is similar to that achieved using simulated annealing but in significantly shorter runtimes.
Keywords :
failure analysis; fault tolerance; integrated circuit design; network-on-chip; simulated annealing; NoC fault tolerance; adaptive remapping; dynamic application remapping; multiple PE failure recovery; network on chip design; simulated annealing; system functionality; Application software; Computer networks; Energy consumption; Fault tolerance; Neodymium; Network-on-a-chip; Routing; Simulated annealing; Thermal stresses; Tiles;
Conference_Titel :
Parallel & Distributed Processing, 2009. IPDPS 2009. IEEE International Symposium on
Conference_Location :
Rome
Print_ISBN :
978-1-4244-3751-1
Electronic_ISBN :
1530-2075
DOI :
10.1109/IPDPS.2009.5161202