DocumentCode
2487176
Title
Enabling terabit per second switch linecard design through chip/package/PCB co-design
Author
Chen, Qinghua Bill ; Zhang, Jianmin ; Qiu, Kelvin ; Padilla, Darja ; Yang, Zhiping ; Scogna, Antonio C. ; Fan, Jun
Author_Institution
Cisco Syst., Inc., San Jose, CA, USA
fYear
2010
fDate
25-30 July 2010
Firstpage
585
Lastpage
590
Abstract
Widespread use of the Web 2.0 Internet applications such as video streaming and social networking are continuously demanding higher bandwidth network equipment. Electrical designers increasingly face more and more challenges to deliver higher speed products within short development cycle due to design complexity and new multi-GHz signal integrity problems. This paper presents a modeling and simulation methodology through chip/package/PCB (printed circuit board) co-design and co-optimization to enable a terabit per second network switch linecard design. Channel design techniques such as BGA (Ball Grid Array) pin backdrill, via tuning, and low loss interconnects are outlined. Full wave 3D modeling techniques with optimal model segmentation, model cascading and model optimization are discussed. At the end, correlation between lab measurement and simulation in both frequency and time domains are investigated.
Keywords
ball grid arrays; integrated circuit interconnections; integrated circuit modelling; integrated circuit packaging; printed circuit design; telecommunication equipment; Web 2.0 Internet; ball grid array; bandwidth network equipment; channel design; chip/package/PCB codesign; design complexity; full wave 3D modeling; higher speed product; low loss interconnect; model cascading; model optimization; multiGHz signal integrity; optimal model segmentation; pin backdrill; printed circuit board; terabit per second network switch linecard design; Dielectric losses; Insertion loss; Integrated circuit modeling; Loss measurement; Materials; Scattering parameters; Solid modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
Conference_Location
Fort Lauderdale, FL
ISSN
2158-110X
Print_ISBN
978-1-4244-6305-3
Type
conf
DOI
10.1109/ISEMC.2010.5711342
Filename
5711342
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