• DocumentCode
    2487176
  • Title

    Enabling terabit per second switch linecard design through chip/package/PCB co-design

  • Author

    Chen, Qinghua Bill ; Zhang, Jianmin ; Qiu, Kelvin ; Padilla, Darja ; Yang, Zhiping ; Scogna, Antonio C. ; Fan, Jun

  • Author_Institution
    Cisco Syst., Inc., San Jose, CA, USA
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    585
  • Lastpage
    590
  • Abstract
    Widespread use of the Web 2.0 Internet applications such as video streaming and social networking are continuously demanding higher bandwidth network equipment. Electrical designers increasingly face more and more challenges to deliver higher speed products within short development cycle due to design complexity and new multi-GHz signal integrity problems. This paper presents a modeling and simulation methodology through chip/package/PCB (printed circuit board) co-design and co-optimization to enable a terabit per second network switch linecard design. Channel design techniques such as BGA (Ball Grid Array) pin backdrill, via tuning, and low loss interconnects are outlined. Full wave 3D modeling techniques with optimal model segmentation, model cascading and model optimization are discussed. At the end, correlation between lab measurement and simulation in both frequency and time domains are investigated.
  • Keywords
    ball grid arrays; integrated circuit interconnections; integrated circuit modelling; integrated circuit packaging; printed circuit design; telecommunication equipment; Web 2.0 Internet; ball grid array; bandwidth network equipment; channel design; chip/package/PCB codesign; design complexity; full wave 3D modeling; higher speed product; low loss interconnect; model cascading; model optimization; multiGHz signal integrity; optimal model segmentation; pin backdrill; printed circuit board; terabit per second network switch linecard design; Dielectric losses; Insertion loss; Integrated circuit modeling; Loss measurement; Materials; Scattering parameters; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
  • Conference_Location
    Fort Lauderdale, FL
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4244-6305-3
  • Type

    conf

  • DOI
    10.1109/ISEMC.2010.5711342
  • Filename
    5711342