• DocumentCode
    2487248
  • Title

    Rapid simulation of the statistical variation of crosstalk in cable harness bundles

  • Author

    Li, Xiang ; Wu, Meilin ; Beetner, Daryl ; Hubing, Todd

  • Author_Institution
    Missouri Univ. of Sci. & Technol., Rolla, MO, USA
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    614
  • Lastpage
    619
  • Abstract
    Accurate assessment of crosstalk problems in cable harnesses requires simulation methods that account for statistical variation in harness parameters. Use of the T-parameter method to rapidly estimate the statistical variation of crosstalk in cable harness bundles is outlined. Crosstalk is calculated by segmenting the harness into a cascade of equal length multi-conductor transmission lines (MTLs). Methods to test the influence of the statistical variation in wire positions, height, and number of twists are proposed using both T-parameter simulation and analytical methods. The analytical method uses the mean and variance of crosstalk estimated for fixed harness parameter values to estimate the mean and variance when parameters vary with known probability density functions. The analytical method may thus save additional computation time, since simulations are only required for a relatively small number of fixed parameter values. More importantly, the analytical method may give additional insight into the cause of problems. A comparison of the simulated and analytical results shows the analytical method can accurately estimate statistical variation for the parameters studied.
  • Keywords
    cables (electric); electromagnetic interference; multiconductor transmission lines; probability; T parameter; cable harness bundles; crosstalk; multiconductor transmission lines; probability density functions; statistical variation; Computational modeling; Crosstalk; Integrated circuit modeling; Mathematical model; Power cables; Scattering parameters; Wire; Crosstalk; cable bundle; modeling; statistics; vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
  • Conference_Location
    Fort Lauderdale, FL
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4244-6305-3
  • Type

    conf

  • DOI
    10.1109/ISEMC.2010.5711347
  • Filename
    5711347