• DocumentCode
    2487395
  • Title

    An equivalent three-dipole model for IC radiated emissions based on TEM cell measurements

  • Author

    Pan, Siming ; Kim, Jingook ; Kim, Sungnam ; Park, Jaesu ; Oh, Heoncheol ; Fan, Jun

  • Author_Institution
    EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    652
  • Lastpage
    656
  • Abstract
    An equivalent dipole model is proposed in this paper to represent the source of radiated electromagnetic emissions from an integrated circuit (IC). The height of an IC is usually much smaller than its length and width, so only three dipole moments are sufficient to characterize an IC in terms of its electromagnetic emissions. The dipole moments can be extracted from three TEM cell measurements. The radiated fields from the IC can then be calculated based on the extracted dipole sources. This IC emission model with three dipole moments is validated using the far-field measurements in a semi anechoic chamber for a test IC. For complex structures, it is desirable that the extracted dipole moments can be incorporated into a commercial full-wave tool as equivalent sources to simulate the radiations from an IC. This is demonstrated using an approach developed in this paper.
  • Keywords
    TEM cells; electromagnetic compatibility; integrated circuit design; IC emission model; IC radiated electromagnetic emission; TEM cell measurement; equivalent three-dipole moment; far-field measurement; semianechoic chamber; Antenna measurements; Dipole antennas; Integrated circuit modeling; Magnetic field measurement; Semiconductor device measurement; TEM cells; IC emission model; TEM cell measurement; dipole moments; far-field measurement; incorporating IC emission model in full-wave tools;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
  • Conference_Location
    Fort Lauderdale, FL
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4244-6305-3
  • Type

    conf

  • DOI
    10.1109/ISEMC.2010.5711354
  • Filename
    5711354