DocumentCode
2487395
Title
An equivalent three-dipole model for IC radiated emissions based on TEM cell measurements
Author
Pan, Siming ; Kim, Jingook ; Kim, Sungnam ; Park, Jaesu ; Oh, Heoncheol ; Fan, Jun
Author_Institution
EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
fYear
2010
fDate
25-30 July 2010
Firstpage
652
Lastpage
656
Abstract
An equivalent dipole model is proposed in this paper to represent the source of radiated electromagnetic emissions from an integrated circuit (IC). The height of an IC is usually much smaller than its length and width, so only three dipole moments are sufficient to characterize an IC in terms of its electromagnetic emissions. The dipole moments can be extracted from three TEM cell measurements. The radiated fields from the IC can then be calculated based on the extracted dipole sources. This IC emission model with three dipole moments is validated using the far-field measurements in a semi anechoic chamber for a test IC. For complex structures, it is desirable that the extracted dipole moments can be incorporated into a commercial full-wave tool as equivalent sources to simulate the radiations from an IC. This is demonstrated using an approach developed in this paper.
Keywords
TEM cells; electromagnetic compatibility; integrated circuit design; IC emission model; IC radiated electromagnetic emission; TEM cell measurement; equivalent three-dipole moment; far-field measurement; semianechoic chamber; Antenna measurements; Dipole antennas; Integrated circuit modeling; Magnetic field measurement; Semiconductor device measurement; TEM cells; IC emission model; TEM cell measurement; dipole moments; far-field measurement; incorporating IC emission model in full-wave tools;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
Conference_Location
Fort Lauderdale, FL
ISSN
2158-110X
Print_ISBN
978-1-4244-6305-3
Type
conf
DOI
10.1109/ISEMC.2010.5711354
Filename
5711354
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