DocumentCode :
2487395
Title :
An equivalent three-dipole model for IC radiated emissions based on TEM cell measurements
Author :
Pan, Siming ; Kim, Jingook ; Kim, Sungnam ; Park, Jaesu ; Oh, Heoncheol ; Fan, Jun
Author_Institution :
EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
fYear :
2010
fDate :
25-30 July 2010
Firstpage :
652
Lastpage :
656
Abstract :
An equivalent dipole model is proposed in this paper to represent the source of radiated electromagnetic emissions from an integrated circuit (IC). The height of an IC is usually much smaller than its length and width, so only three dipole moments are sufficient to characterize an IC in terms of its electromagnetic emissions. The dipole moments can be extracted from three TEM cell measurements. The radiated fields from the IC can then be calculated based on the extracted dipole sources. This IC emission model with three dipole moments is validated using the far-field measurements in a semi anechoic chamber for a test IC. For complex structures, it is desirable that the extracted dipole moments can be incorporated into a commercial full-wave tool as equivalent sources to simulate the radiations from an IC. This is demonstrated using an approach developed in this paper.
Keywords :
TEM cells; electromagnetic compatibility; integrated circuit design; IC emission model; IC radiated electromagnetic emission; TEM cell measurement; equivalent three-dipole moment; far-field measurement; semianechoic chamber; Antenna measurements; Dipole antennas; Integrated circuit modeling; Magnetic field measurement; Semiconductor device measurement; TEM cells; IC emission model; TEM cell measurement; dipole moments; far-field measurement; incorporating IC emission model in full-wave tools;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
Conference_Location :
Fort Lauderdale, FL
ISSN :
2158-110X
Print_ISBN :
978-1-4244-6305-3
Type :
conf
DOI :
10.1109/ISEMC.2010.5711354
Filename :
5711354
Link To Document :
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