Title :
Improved Robustness Test Sequences Generation Algorithm
Author :
Gao Xiang ; Yan Xue-xiong ; Kang Fei ; You Ye-bin
Author_Institution :
Nat. Digital Switching Syst. Eng., Technol. R&D Center, Zhengzhou, China
Abstract :
Sequence generation is a key technology in protocol robustness testing. WANG Le-chun proposed a robustness sequence generation algorithm based on FSM, but if the algorithm is directly used in EFSM, the test sequence may be unenforceable. For this problem, in this paper the original algorithm is improved by adding changing parameter, replacing, removing the three kinds of processing methods, robustness testing of IKE shows that the improved algorithm has effectively solved the problem of enforceability.
Keywords :
computer networks; finite state machines; protocols; stability; EFSM; FSM; IKE; protocol robustness testing; robustness test sequences generation algorithm; Algorithm design and analysis; Computer errors; Computer network reliability; Electronic mail; Protocols; Research and development; Robustness; Switching systems; System testing; Systems engineering and theory;
Conference_Titel :
e-Business and Information System Security (EBISS), 2010 2nd International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-5893-6
Electronic_ISBN :
978-1-4244-5895-0
DOI :
10.1109/EBISS.2010.5473718