An HF/VHF automated microcircuit admittance bridge for operation in a -60/spl deg/C to +125/spl deg/C air chamber with milliKelvin stability

Author

Hafner, E.

Author_Institution

Xotex Corp., Tinton Falls, NJ, USA

fYear

1996

fDate

17-21 June 1996

Firstpage

606

Lastpage

607

Abstract

An electronically tunable admittance bridge is described which is self-calibrating and reproduces DC/LF measurements of resistance/capacitance to better than 2%, with a repeatability of a few microSiemens and a few femtoFarad respectively. It now is used in the 1 MHz to 160 MHz range, primarily as the measuring head in an air chamber for the evaluation of the aging and frequency/temperature characteristics of a multitude of crystal resonators, mounted on a transport rack. The 1 m/sup 3/ temperature chamber has a range of -60/spl deg/C to +125/spl deg/C and a stability of a few milliKelvin at any set-point in that range.

Keywords

automatic test equipment; bridge instruments; calibration; capacitance measurement; crystal resonators; electric admittance measurement; electric resistance measurement; network analysers; -60 to 125 C; 1 to 160 MHz; DC/LF measurements; HF/VHF automated microcircuit admittance bridge; aging evaluation; air chamber; automatic measurement; capacitance; crystal resonators; electronically tunable admittance bridge; frequency-temperature characteristics; milliKelvin stability; one-port device characteristics; resistance; self-calibrating; temperature chamber; Admittance measurement; Aging; Bridge circuits; Capacitance measurement; Electrical resistance measurement; Frequency measurement; Hafnium; Stability; Temperature distribution; Ultrafast electronics;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements Digest, 1996 Conference on

Conference_Location

Braunschweig, Germany

Print_ISBN

0-7803-3376-4

Type

conf

DOI

10.1109/CPEM.1996.547372

Filename

547372