DocumentCode :
2487549
Title :
Study of Frequency Control Devices in the Scanning Electron Microscope
Author :
Gerdes, R.J. ; Wagner, C.E.
fYear :
1971
fDate :
1971
Firstpage :
118
Lastpage :
124
Keywords :
Conductive films; Crystals; Electron beams; Frequency control; Insulation; Resonance; Scanning electron microscopy; Surface charging; Surface topography; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
25th Annual Symposium on Frequency Control. 1971
Type :
conf
DOI :
10.1109/FREQ.1971.199845
Filename :
1536785
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2487549
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