Title :
Quantifying the quality of agreement between simulation and validation data for multiple data sets
Author :
Archambeault, Bruce ; Diepenbrock, Joseph
Author_Institution :
IBM, Research Triangle Park, NC, USA
Abstract :
The FSV is used to compare multiple data sets. These data sets may be comparing modeled data for model validation purposes, or may be multiple measurements of related data, to determine the agreement between them.
Keywords :
computational electromagnetics; electromagnetic compatibility; FSV; feature selective validation data; multiple data set; Communication cables; Data models; Electromagnetic compatibility; Frequency division multiplexing; Frequency measurement; Histograms; Integrated circuit modeling; CEM; Feature Selective Validation; Validation;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
Conference_Location :
Fort Lauderdale, FL
Print_ISBN :
978-1-4244-6305-3
DOI :
10.1109/ISEMC.2010.5711367
