Title : 
Tracking single dynamic MEG dipole sources using the projected extended Kalman filter
         
        
            Author : 
Yao, Yuchen ; Swindlehurst, A. Lee
         
        
            Author_Institution : 
Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Irvine, CA, USA
         
        
        
            fDate : 
Aug. 30 2011-Sept. 3 2011
         
        
        
        
            Abstract : 
This paper presents two new algorithms based on the Extended Kalman Filter (EKF) for tracking the parameters of single dynamic magnetoencephalography (MEG) dipole sources. We assume a dynamic MEG dipole source with possibly both time-varying location and dipole orientation. The standard EKF-based tracking algorithm performs well under the assumption that the dipole source components vary in time as a Gauss-Markov process, provided that the background noise is temporally stationary. We propose a Projected-EKF algorithm that is adapted to a more forgiving condition where the background noise is temporally nonstationary, as well as a Projected-GLS-EKF algorithm that works even more universally, when the dipole components vary arbitrarily from one sample to the next.
         
        
            Keywords : 
Gaussian processes; Kalman filters; Markov processes; magnetoencephalography; medical signal processing; Gauss-Markov process; dipole orientation; projected extended Kalman filter algorithm; single dynamic MEG dipole source; single dynamic magnetoencephalography dipole sources; time varying location; Brain modeling; Heuristic algorithms; Interference; Magnetic sensors; Noise measurement; Vectors; Algorithms; Brain; Magnetoencephalography; Models, Theoretical;
         
        
        
        
            Conference_Titel : 
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
         
        
            Conference_Location : 
Boston, MA
         
        
        
            Print_ISBN : 
978-1-4244-4121-1
         
        
            Electronic_ISBN : 
1557-170X
         
        
        
            DOI : 
10.1109/IEMBS.2011.6091083