DocumentCode
2488014
Title
Including EMC in risk assessments
Author
Armstrong, Keith
Author_Institution
Cherry Clough Consultants, USA
fYear
2010
fDate
25-30 July 2010
Firstpage
796
Lastpage
801
Abstract
The reliability of electronic technologies (including the software and firmware that runs on them) can become critical, when the consequences of errors, malfunctions or other types of failure include significant financial loss, mission loss, or harm to people, domestic animals or property (i.e. functional safety). Electromagnetic interference (EMI) can be a cause of unreliability in all electronic technologies, so electromagnetic compatibility (EMC) must be taken into account when the risks caused by malfunctioning electronics are to be controlled. However, levels of reliability or safety risk can be three orders of magnitude beyond what could possibly be demonstrated with any practicable EMC testing regime. The challenge for engineers is to demonstrate adequate confidence in the reliability of their designs in the operational electromagnetic environment. The solution is to use well-proven EMC design techniques, plus risk assessment that shows the overall design achieves acceptable risk levels, all verified and validated by a variety of techniques (including EMC testing). This paper addresses how to apply risk assessment techniques to issues of electromagnetic compatibility (EMC).
Keywords
electromagnetic compatibility; electromagnetic interference; risk management; electromagnetic compatibility design; electromagnetic compatibility testing; electromagnetic interference; electronic technology reliability; firmware; operational electromagnetic environment; risk assessment; safety risk; software; Electromagnetic compatibility; Electromagnetic interference; Hazards; Reliability; Risk management; Cost-effectiveness; EMC; EMI; functional safety; high-reliability; mission-critical; reliability; risk analysis; safety risks; safety-critical; security;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
Conference_Location
Fort Lauderdale, FL
ISSN
2158-110X
Print_ISBN
978-1-4244-6305-3
Type
conf
DOI
10.1109/ISEMC.2010.5711381
Filename
5711381
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