• DocumentCode
    2488014
  • Title

    Including EMC in risk assessments

  • Author

    Armstrong, Keith

  • Author_Institution
    Cherry Clough Consultants, USA
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    796
  • Lastpage
    801
  • Abstract
    The reliability of electronic technologies (including the software and firmware that runs on them) can become critical, when the consequences of errors, malfunctions or other types of failure include significant financial loss, mission loss, or harm to people, domestic animals or property (i.e. functional safety). Electromagnetic interference (EMI) can be a cause of unreliability in all electronic technologies, so electromagnetic compatibility (EMC) must be taken into account when the risks caused by malfunctioning electronics are to be controlled. However, levels of reliability or safety risk can be three orders of magnitude beyond what could possibly be demonstrated with any practicable EMC testing regime. The challenge for engineers is to demonstrate adequate confidence in the reliability of their designs in the operational electromagnetic environment. The solution is to use well-proven EMC design techniques, plus risk assessment that shows the overall design achieves acceptable risk levels, all verified and validated by a variety of techniques (including EMC testing). This paper addresses how to apply risk assessment techniques to issues of electromagnetic compatibility (EMC).
  • Keywords
    electromagnetic compatibility; electromagnetic interference; risk management; electromagnetic compatibility design; electromagnetic compatibility testing; electromagnetic interference; electronic technology reliability; firmware; operational electromagnetic environment; risk assessment; safety risk; software; Electromagnetic compatibility; Electromagnetic interference; Hazards; Reliability; Risk management; Cost-effectiveness; EMC; EMI; functional safety; high-reliability; mission-critical; reliability; risk analysis; safety risks; safety-critical; security;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2010 IEEE International Symposium on
  • Conference_Location
    Fort Lauderdale, FL
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4244-6305-3
  • Type

    conf

  • DOI
    10.1109/ISEMC.2010.5711381
  • Filename
    5711381