• DocumentCode
    24885
  • Title

    Compact DC Modeling of Organic Field-Effect Transistors: Review and Perspectives

  • Author

    Chang-Hyun Kim ; Bonnassieux, Yvan ; Horowitz, Gilles

  • Author_Institution
    Lab. de Phys. des Interfaces et des Couches Minces (LPICM), Ecole Polytech., Palaiseau, France
  • Volume
    61
  • Issue
    2
  • fYear
    2014
  • fDate
    Feb. 2014
  • Firstpage
    278
  • Lastpage
    287
  • Abstract
    In spite of impressive improvements achieved for organic field-effect transistors (OFETs), there is still a lack of theoretical understanding of their behaviors. Furthermore, it is challenging to develop a universal model that would cover a huge variety of materials and device structures available for state-of-the-art OFETs. Nonetheless, currently there is a strong need for specific OFET compact models when device-to-system integration is an important issue. We briefly describe the most fundamental characters of organic semiconductors and OFETs, which set the bottom line dictating the requirement of an original model different from that of conventional inorganic devices. Along with an introduction to the principles of compact modeling for circuit simulation, a comparative analysis of the reported models is presented with an emphasis on their primary assumptions and applicability aspects. Critical points for advancing OFET compact models are discussed in consideration of the recent understanding of device physics.
  • Keywords
    organic field effect transistors; OFET models; applicability aspects; circuit simulation; compact dc modeling; comparative analysis; critical points; device physics; device structures; device-to-system integration; inorganic devices; organic field-effect transistors; organic semiconductors; primary assumptions; universal model; Integrated circuit modeling; Logic gates; Mathematical model; OFETs; Organic semiconductors; Semiconductor device modeling; Circuit simulation; compact modeling; device physics; organic field-effect transistors (OFETs);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2013.2281054
  • Filename
    6609043