Title :
Detecting defects in repeatedly patterned image with spatially different level of noise
Author :
Deokyoung Kang ; Hae-na Lee ; Yoo, S.I.
Author_Institution :
Dept. of Comput. Sci. & Eng., Seoul Nat. Univ., Seoul, South Korea
Abstract :
Defect detection is to find unexpected peak regions in an inspection image. Stable Principal Component Pursuit (SPCP) decomposes a given image into three matrices, low-rank, sparsity, and noise which are used for detecting defects. Each of them contains repeated pattern, spatially narrow abnormal elements which are regarded as defects, and small magnitude elements respectively. However, if the noise level of the image is spatially varied, it is hard to separate noise appropriately using naive SPCP. To overcome the difficulty, we propose a novel sliding-window based SPCP algorithm. First, a repeated pattern of each sliding-window is converted to a matrix for SPCP. The noise level based on rank-one approximation is then estimated, and the matrix decomposition is performed. Finally, the sparsity values of all sliding-windows are merged by averaging, and then the averaged term is used for defect detection. The experimental results show that our algorithm outperforms the traditional approaches.
Keywords :
matrix decomposition; object detection; principal component analysis; defect detection; inspection image; matrix decomposition; noise level; rank-one approximation; repeatedly patterned image; sliding-window based SPCP algorithm; sparsity values; stable principal component pursuit; Approximation methods; Inspection; Matrix decomposition; Noise; Noise level; Organic light emitting diodes; Robustness; Defect Detection; Low-rank Sparsity Decomposition; Robust Principal Component Analysis; Sliding-Window; Stable Principal Component Pursuit;
Conference_Titel :
Image Processing (ICIP), 2014 IEEE International Conference on
Conference_Location :
Paris
DOI :
10.1109/ICIP.2014.7025659