DocumentCode
2489220
Title
In-situ comparisons of moored acoustic Doppler profilers with conventional VACM and VMCM current meters
Author
Irish, James D. ; Plueddemann, Albert J. ; Lentz, Steven J.
Author_Institution
Woods Hole Oceanogr. Instn., MA, USA
fYear
1995
fDate
7-9 Feb 1995
Firstpage
59
Lastpage
64
Abstract
Experiments in Massachusetts Bay, the North Atlantic and the Northern California Shelf are examined where 150 and 300 kHz RD Instruments acoustic Doppler current profilers (ADCPs) were deployed near vector averaging (VACM) and vector measuring (VMCM) current meters. The ADCPs were deployed in-line on surface moorings, in both upward and downward looking configurations. Comparisons of ADCP velocities with those of VACMs and VMCMs were used to evaluate the quality of the ADCP data obtained in the surface-moored configuration, and to identify any systematic differences between the ADCP and VACM/VMCM observations. Unlike conventional current meters, the ADCPs were limited by instrumental noise at high frequencies. Regressions of ADCP versus VMCM or VACM speeds showed typical mean differences of 1 to 2 cm/sec and rms differences of about 3 cm/sec. These speed differences are similar to comparisons between conventional current meters. Comparison of ADCP and VACM/VMCM directions showed the direction difference to be a function of direction. The maximum mean difference was 14°. These directional differences (attributed to flux-gate compass enters) appear to be the limiting factor in both ADCP and conventional velocity measurements
Keywords
flow measurement; flowmeters; oceanographic equipment; oceanographic techniques; sonar; ultrasonic applications; ultrasonic equipment; 150 kHz; 300 kHz; ADCP; VACM; VMCM; acoustic Doppler current profiler; apparatus instrument equipment; dynamics; flowmeter flow meter; in situ comparison; moored acoustic Doppler profiler; ocean current; sea; sonar; ultrasonic measurement technique; vector averaging current meter; vector measuring current meter; velocity measurements; Acoustic measurements; Current measurement; Frequency; Instruments; Oceans; Pollution measurement; Sea measurements; Sea surface; Surface contamination; Velocity measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Current Measurement, 1995., Proceedings of the IEEE Fifth Working Conference on
Conference_Location
St. Petersburg, FL
Print_ISBN
0-7803-2437-4
Type
conf
DOI
10.1109/CCM.1995.516151
Filename
516151
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