• DocumentCode
    2489439
  • Title

    IDDQ testing on a custom automotive IC

  • Author

    Mallarapu, Shobha R. ; Hoffman, Albeit J.

  • Author_Institution
    Delco Electron. Corp., Kokomo, IN, USA
  • fYear
    1994
  • fDate
    1-4 May 1994
  • Firstpage
    405
  • Lastpage
    408
  • Abstract
    This paper presents the impact of quiescent current (IDDQ ) test on the fallout of a CMOS custom automotive IC designed to perform IDDQ tests, IDDQ patterns developed for this IC, together with the fault-graded patterns, achieved significantly higher fault coverage compared to the conventional Single Stuck-at-Fault (SAF) approach alone. We will show how the IC was designed to accommodate IDDQ testing, how the IDDQ faults were targeted and detected and analyze how it contributed to the reliability of the part. Setting the limits for the quiescent current and the impact of a voltage screen on these tests have also been presented
  • Keywords
    CMOS integrated circuits; automotive electronics; electric current measurement; fault diagnosis; integrated circuit reliability; integrated circuit testing; mixed analogue-digital integrated circuits; IDDQ testing; custom automotive IC; fault coverage; fault-graded patterns; quiescent current test; reliability; single stuck-at-fault; voltage screen; Automotive engineering; CMOS integrated circuits; Circuit faults; Circuit testing; Electrical fault detection; Electronic equipment testing; Fault detection; Integrated circuit testing; Read-write memory; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 1994., Proceedings of the IEEE 1994
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-1886-2
  • Type

    conf

  • DOI
    10.1109/CICC.1994.379693
  • Filename
    379693
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2489439