Dedicated protective functions of automotive ICs and design examples

Author

Lechner, A. ; Draxelmayr, D. ; Irmer, H. ; Zitta, H. ; Melbert, J.

Author_Institution

Siemens Microelectron. Dev. Center, Villach, Austria

fYear

1994

fDate

1-4 May 1994

Firstpage

327

Lastpage

330

Abstract

Semiconductors in automotive applications require protection against broad variety of stresses imposed on them at the device, board and system level. The overall reliability of electronic systems comprising of sensor ICs, microcontrollers and smart power ICs can be achieved only when innovative protection concepts are used in each component. Several examples of protective functions such as improved power supply rejection in sensor circuits, fail-safe PLL-based clock generator for microcontrollers and di/dt-limited DMOS drive circuit to ensure electromagnetic compatibility of smart power devices are presented in this paper

Keywords

automotive electronics; driver circuits; electric sensing devices; electromagnetic compatibility; integrated circuit reliability; microcontrollers; phase locked loops; power integrated circuits; power semiconductor switches; protection; timing circuits; EMC; automotive ICs; dedicated protective functions; di/dt-limited DMOS drive circuit; electromagnetic compatibility; electronic systems; fail-safe PLL-based clock generator; microcontrollers; power electronics; power supply rejection; reliability; sensor circuits; smart power devices; Automotive applications; Automotive engineering; Intelligent sensors; Microcontrollers; Power integrated circuits; Power supplies; Power system protection; Power system reliability; Sensor systems; Stress;

fLanguage

English

Publisher

ieee

Conference_Titel

Custom Integrated Circuits Conference, 1994., Proceedings of the IEEE 1994

Conference_Location

San Diego, CA

Print_ISBN

0-7803-1886-2

Type

conf

DOI

10.1109/CICC.1994.379709

Filename

379709