Title :
A moment method for statistical analysis of high speed VLSI interconnects
Author :
Li, L.L. ; Zhang, Q.J. ; Nakhla, M.
Author_Institution :
Dept. of Electron., Carleton Univ., Ottawa, Ont., Canada
Abstract :
Statistical analysis of VLSI interconnects is important in manufacturability-driven design of printed circuit boards (PCB) and multichip modules (MCM). Conventional Monte-Carlo method for such an analysis requires highly repetitive circuit simulations and is computationally intensive. This paper presents an alternative approach for statistical analysis. An analytical and explicit relationship between the statistics of the circuit output and that of circuit parameters is derived. It is based on statistical moment theory and does not require Monte-Carlo analysis. The approach is suitable for fast estimation of network statistical performances and is confirmed by examples for VLSI interconnect delay and ground noise analysis
Keywords :
VLSI; circuit CAD; delays; integrated circuit interconnections; method of moments; multichip modules; network parameters; printed circuit design; statistical analysis; VLSI interconnect delay; circuit parameters; ground noise analysis; high speed VLSI interconnects; manufacturability-driven design; moment method; multichip modules; network statistical performances; printed circuit boards; statistical analysis; Circuit analysis computing; Circuit simulation; Delay estimation; Integrated circuit interconnections; Manufacturing; Moment methods; Multichip modules; Printed circuits; Statistical analysis; Very large scale integration;
Conference_Titel :
Custom Integrated Circuits Conference, 1994., Proceedings of the IEEE 1994
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-1886-2
DOI :
10.1109/CICC.1994.379713
