Title : 
Performance modeling of analog circuits using additive regression splines
         
        
            Author : 
Chao, C.-Y. ; Milor, Linda
         
        
            Author_Institution : 
Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
         
        
        
        
        
        
            Abstract : 
Circuit designers need to be able to predict variations in circuit performance as a function of variations in process parameters. Often the relation between process parameters and circuit performances is highly nonlinear, and the process is described by a large number of independent variables. Traditional approaches to modeling, like polynomial regression, are not very accurate for such problems. In order to build accurate nonlinear models for high-dimensional problems, an algorithm has been implemented based on additive regression splines. The model building process is fully automated. The algorithm is used to build a model to predict the offset voltage of a parallel SC filter bank. This example demonstrates that very accurate nonlinear models can be constructed very efficiently
         
        
            Keywords : 
VLSI; active filters; analogue integrated circuits; circuit analysis computing; circuit optimisation; integrated circuit design; integrated circuit modelling; splines (mathematics); switched capacitor filters; additive regression splines; analog circuits; high-dimensional problems; nonlinear models; offset voltage; parallel SC filter bank; performance modeling; process parameters; Analog circuits; Buildings; Circuit optimization; Educational institutions; Filter bank; Least squares approximation; Least squares methods; Polynomials; Predictive models; Stochastic processes;
         
        
        
        
            Conference_Titel : 
Custom Integrated Circuits Conference, 1994., Proceedings of the IEEE 1994
         
        
            Conference_Location : 
San Diego, CA
         
        
            Print_ISBN : 
0-7803-1886-2
         
        
        
            DOI : 
10.1109/CICC.1994.379714