Title :
Parametric yield prediction of complex, mixed-signal ICs
Author :
O´Leary, Martin ; Lyden, Colin
Author_Institution :
Nat. Microelectron. Res. Centre, Univ. Coll. Cork, Ireland
Abstract :
A method is presented which helps the designer to quickly predict the parametric yield of complex, mixed-signal ICs. It builds on previous approaches which use behavioural simulation, regression modelling and a hierarchical approach to perform this task. A novel enhancement is proposed which overcomes some of the inaccuracies introduced from using regression models to generate predictions for test result distributions
Keywords :
circuit analysis computing; circuit optimisation; integrated circuit design; integrated circuit yield; mixed analogue-digital integrated circuits; network parameters; behavioural simulation; complex ICs; hierarchical approach; mixed-signal ICs; parametric yield prediction; regression modelling; test result distributions; Circuit testing; Educational institutions; Integrated circuit modeling; Integrated circuit testing; Linear regression; Microelectronics; Monte Carlo methods; Production; SPICE; Semiconductor device modeling;
Conference_Titel :
Custom Integrated Circuits Conference, 1994., Proceedings of the IEEE 1994
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-1886-2
DOI :
10.1109/CICC.1994.379716
