• DocumentCode
    2489890
  • Title

    Amplitude-sensitive interferometric ellipsometer on TN-LCD optical parameters measurement

  • Author

    Wei, H.C. ; Tsai, C.C. ; Chou, C.

  • Author_Institution
    Nat. Yang Ming Univ., Taipei
  • fYear
    2007
  • fDate
    17-19 Oct. 2007
  • Firstpage
    37
  • Lastpage
    39
  • Abstract
    This research proposes an amplitude-sensitive heterodyne interferometric ellipsometer to determine TN-LC cell parameters precisely based on single wavelength at normal incidence. The advantage is the capability of two dimensional distribution measurement using CCD camera.
  • Keywords
    ellipsometry; light interferometry; CCD camera; amplitude-sensitive interferometric ellipsometer; heterodyne interferometric ellipsometer; optical parameters measurement; two dimensional distribution measurement; Ellipsometry; Frequency; Laser beams; Liquid crystals; Optical interferometry; Optical mixing; Optical polarization; Optical variables control; Phase detection; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical Fiber Communication and Optoelectronics Conference, 2007 Asia
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-0-9789217-2-9
  • Electronic_ISBN
    978-0-9789217-2-9
  • Type

    conf

  • DOI
    10.1109/AOE.2007.4410696
  • Filename
    4410696
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2489890