DocumentCode :
2490347
Title :
Combine hierarchical appearance statistics for accurate palmprint recognition
Author :
Han, Yufei ; Sun, Zhenan ; Tan, Tieniu
Author_Institution :
Center for Biometrics & Security Res., Chinese Acad. of Sci., China
fYear :
2008
fDate :
8-11 Dec. 2008
Firstpage :
1
Lastpage :
4
Abstract :
Palmprint recognition is an active member of biometrics in recent years. State-of-the-art algorithms of palmprint recognition describe appearances of palmprints efficiently through local texture analysis. Following this framework, we propose a novel approach of palmprint recognition in this paper, which represents palmprint images based on statistics and spatial arrangement of appearance descriptors within local image areas. In this method, we firstly design a robust descriptor to encode properties of palmprint appearances of local regions. The whole image is divided into non-overlapped blocks at increasingly fine resolutions successively, so as to describe the spatial layout in hierarchical scales. For a specific spatial resolution, local distributions of the proposed descriptors in the blocks are concatenated to represent structures of palmprint structures. Finally, distribution information of different resolutions is combined to provide complementary descriptive power. Promising experimental results demonstrate that the proposed method achieves even better performances than the state-of-the-art approaches.
Keywords :
biometrics (access control); image recognition; image resolution; image texture; accurate palmprint recognition; appearance descriptors; biometrics; complementary descriptive power; hierarchical appearance statistics; image resolutions; palmprint images; palmprint structures; robust descriptor; spatial arrangement; spatial resolution; state-of-the-art algorithms; texture analysis; Algorithm design and analysis; Biometrics; Concatenated codes; Design methodology; Image recognition; Image resolution; Image texture analysis; Robustness; Spatial resolution; Statistics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 2008. ICPR 2008. 19th International Conference on
Conference_Location :
Tampa, FL
ISSN :
1051-4651
Print_ISBN :
978-1-4244-2174-9
Electronic_ISBN :
1051-4651
Type :
conf
DOI :
10.1109/ICPR.2008.4761859
Filename :
4761859
Link To Document :
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