DocumentCode
2490476
Title
Automatic synthesis and the cost of testing
Author
Marchok, Thomas E. ; Mary, W.
Author_Institution
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
1994
fDate
1-4 May 1994
Firstpage
132
Lastpage
135
Abstract
Retiming has been postulated as an optimization technique which increases performance at the expense of area. This paper shows that a relationship exists between performance and testability. Designers must be aware of this relationship as the blind use of synthesis tools may yield unexpected and dramatic results. This paper demonstrates that retiming can increase the test generation time required to attain a given fault efficiency by more than two orders of magnitude, and cause a considerable decrease in the fault coverage which is attained
Keywords
circuit CAD; circuit optimisation; fault diagnosis; integrated circuit design; integrated circuit testing; automatic synthesis; fault coverage; fault efficiency; optimization technique; performance; retiming; synthesis tools; test generation time; testability; testing cost; Automatic testing; Circuit faults; Circuit synthesis; Circuit testing; Costs; Delay; Job design; Sequential analysis; Sequential circuits; Space exploration;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 1994., Proceedings of the IEEE 1994
Conference_Location
San Diego, CA
Print_ISBN
0-7803-1886-2
Type
conf
DOI
10.1109/CICC.1994.379751
Filename
379751
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