• DocumentCode
    2490476
  • Title

    Automatic synthesis and the cost of testing

  • Author

    Marchok, Thomas E. ; Mary, W.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    1994
  • fDate
    1-4 May 1994
  • Firstpage
    132
  • Lastpage
    135
  • Abstract
    Retiming has been postulated as an optimization technique which increases performance at the expense of area. This paper shows that a relationship exists between performance and testability. Designers must be aware of this relationship as the blind use of synthesis tools may yield unexpected and dramatic results. This paper demonstrates that retiming can increase the test generation time required to attain a given fault efficiency by more than two orders of magnitude, and cause a considerable decrease in the fault coverage which is attained
  • Keywords
    circuit CAD; circuit optimisation; fault diagnosis; integrated circuit design; integrated circuit testing; automatic synthesis; fault coverage; fault efficiency; optimization technique; performance; retiming; synthesis tools; test generation time; testability; testing cost; Automatic testing; Circuit faults; Circuit synthesis; Circuit testing; Costs; Delay; Job design; Sequential analysis; Sequential circuits; Space exploration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 1994., Proceedings of the IEEE 1994
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-1886-2
  • Type

    conf

  • DOI
    10.1109/CICC.1994.379751
  • Filename
    379751