Title :
Non-rigid registration of longitudinal brain tumor treatment MRI
Author :
Chitphakdithai, Nicha ; Chiang, Veronica L. ; Duncan, James S.
Author_Institution :
Dept. of Biomed. Eng., Yale Univ., New Haven, CT, USA
fDate :
Aug. 30 2011-Sept. 3 2011
Abstract :
To evaluate changes in brain structure or function, longitudinal images of brain tumor patients must be non-rigidly registered to account for tissue deformation due to tumor growth or treatment. Most standard non-rigid registration methods will fail to align these images due to the changing feature correspondences between treatment time points and the large deformations near the tumor site. Here we present a registration method which jointly estimates a label map for correspondences to account for the substantial changes that may occur during tumor treatment. Under a Bayesian parameter estimation framework, we employ different probability distributions depending on the correspondence labels. We incorporate models for image similarity, an image intensity prior, label map smoothing, and a transformation prior that encourages deformation near the estimated tumor location. Our proposed algorithm increases registration accuracy compared to a traditional voxel-based registration method as shown using both synthetic and real patient images.
Keywords :
Bayes methods; biomedical MRI; brain; image registration; medical image processing; tumours; Bayesian parameter estimation framework; brain function; brain structure; image intensity prior; label map smoothing; longitudinal brain tumor treatment MRI; nonrigid registration; probability distribution; tissue deformation; transformation prior; tumor growth; Biomedical imaging; Brain models; Gaussian distribution; Lesions; Algorithms; Brain; Brain Neoplasms; Humans; Image Interpretation, Computer-Assisted; Longitudinal Studies; Magnetic Resonance Imaging; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Subtraction Technique;
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2011.6091212