• DocumentCode
    2491422
  • Title

    Combining Duplication, Partial Reconfiguration and Software for On-line Error Diagnosis and Recovery in SRAM-Based FPGAs

  • Author

    Ilias, Anargyros ; Papadimitriou, Kyprianos ; Dollas, Apostolos

  • Author_Institution
    Dept. of Electron. & Comput. Eng., Tech. Univ. of Crete, Chania, Greece
  • fYear
    2010
  • fDate
    2-4 May 2010
  • Firstpage
    73
  • Lastpage
    76
  • Abstract
    SRAM-based FPGAs are susceptible to Single-Event Upsets (SEUs) in radiation-exposed environments due to their configuration memory. We propose a new scheme for the diagnosis and recovery from upsets that combines i) duplication of the core to be protected, ii) partial reconfiguration to reconfigure the faulty part only, and iii) hardcore processor(s) for deciding when and which part will be reconfigured; executing the application in software instead of hardware during fault handling; and controlling the reconfiguration. A hardcore processor has smaller cross section and it is less susceptible than reconfigurable resources. Thus it can temporarily undertake the execution during upset conditions. Real experiments demonstrate that our approach is feasible and an area reduction of more than 40% over the dominant Triple Modular Redundancy (TMR) solution can be achieved at the cost of a reduction in the processing rate of the input.
  • Keywords
    SRAM chips; field programmable gate arrays; system recovery; SRAM-based FPGA; hardcore processor; online error diagnosis; partial reconfiguration; radiation-exposed environments; single-event upsets; system recovery; triple modular redundancy solution; Application software; Computer errors; Costs; Fault detection; Fault diagnosis; Field programmable gate arrays; Hardware; Redundancy; Resource management; Single event transient; Duplication; Hardcore Processor; Partial reconfiguration; Single-Event Upsets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Field-Programmable Custom Computing Machines (FCCM), 2010 18th IEEE Annual International Symposium on
  • Conference_Location
    Charlotte, NC
  • Print_ISBN
    978-0-7695-4056-6
  • Electronic_ISBN
    978-1-4244-7143-0
  • Type

    conf

  • DOI
    10.1109/FCCM.2010.20
  • Filename
    5474068