Title : 
Use of shift variance of the wavelet transform for signal detection
         
        
            Author : 
Erdol, Nurgun ; Bao, Feng
         
        
            Author_Institution : 
Dept. of Electr. Eng., Florida Atlantic Univ., Boca Raton, FL, USA
         
        
        
        
        
        
            Abstract : 
Characterizes signals according to the degree with which a time shift affects their wavelet series coefficients and develops a measure called the “shift index” to quantify that effect. The authors argue that the shift index can be used to locate, separate and cluster and/or detect pulse like signals with random arrival times. Examples are given to verify the established theory
         
        
            Keywords : 
Gaussian processes; random processes; signal detection; wavelet transforms; pulse like signals; random arrival times; shift index; shift variance; signal detection; time shift; wavelet series coefficients; wavelet transform; Additive noise; Electric variables measurement; Mathematical model; Pulse measurements; Signal detection; Signal processing; Time measurement; Wavelet analysis; Wavelet transforms; Wideband;
         
        
        
        
            Conference_Titel : 
Digital Signal Processing Workshop, 1994., 1994 Sixth IEEE
         
        
            Conference_Location : 
Yosemite National Park, CA
         
        
            Print_ISBN : 
0-7803-1948-6
         
        
        
            DOI : 
10.1109/DSP.1994.379843