Title :
Optimal synaptic learning in non-linear associative memory
Author :
Knoblauch, Andreas
Author_Institution :
Honda Res. Inst. Eur., Offenbach/Main, Germany
Abstract :
Neural associative memories are single layer perceptrons with fast synaptic learning typically storing discrete associations between pairs of neural activity patterns. For linear learning such as employed in Hopfield-type networks it is well known that the so-called covariance rule is optimal resulting in minimal output noise and maximal storage capacity. On the other hand, numerical simulations suggest that nonlinear rules such as clipped Hebbian learning in Willshaw-type networks perform better, at least for sparse neural activity and finite network size. Here I show that the Willshaw and Hopfield models are only limit cases of a general optimal model where synaptic learning is determined by probabilistic Bayesian considerations. Asymptotically, for large networks and very sparse neuron activity the Bayesian model becomes identical to an inhibitory implementation of the Willshaw model. Similarly, for less sparse patterns, the Bayesian model becomes identical to the Hopfield network employing the covariance rule. For intermediate sparseness or finite networks the optimal Bayesian rule differs from both the Willshaw and Hopfield models and can significantly improve memory performance.
Keywords :
Hebbian learning; Hopfield neural nets; belief networks; content-addressable storage; numerical analysis; Bayesian model; Hopfield-type networks; Willshaw-type networks; clipped Hebbian learning; covariance rule; fast synaptic learning; linear learning; neural activity patterns; neural associative memories; nonlinear associative memory; nonlinear rules; numerical simulations; optimal synaptic learning; probabilistic Bayesian considerations; single layer perceptrons; Approximation methods; Associative memory; Bayesian methods; Computational modeling; Neurons; Signal to noise ratio;
Conference_Titel :
Neural Networks (IJCNN), The 2010 International Joint Conference on
Conference_Location :
Barcelona
Print_ISBN :
978-1-4244-6916-1
DOI :
10.1109/IJCNN.2010.5596604