• DocumentCode
    249173
  • Title

    Exact reconstruction in Quantitative Phase Microscopy

  • Author

    Seelamantula, Chandra Sekhar ; Shenoy, Basty Ajay ; Coquoz, Severine ; Lasser, Tobias

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Sci., Bangalore, India
  • fYear
    2014
  • fDate
    27-30 Oct. 2014
  • Firstpage
    3934
  • Lastpage
    3938
  • Abstract
    We address the problem of phase reconstruction in Quantitative Phase Microscopy (QPM). We develop sufficient conditions on the interfering reference wave for exact phase reconstruction in the absence of noise and propose a noniterative phase reconstruction technique. We show that the zero-order artifact, a commonly encountered problem in QPM, can be completely suppressed by the proposed reconstruction technique. The theoretical guarantees pertain to continuous-domain object functions with the additional assumption of being bandlimited. We present results on synthesized phase objects that are effectively bandlimited to show that the proposed method is capable of recovering the phase acurately. In cases of images where the phase exhibits large excursions, unwrapping becomes necessary, for which we employ Goldstein´s phase unwrapping algorithm.
  • Keywords
    biological techniques; biomedical measurement; biomedical optical imaging; optical microscopy; Goldstein phase unwrapping algorithm; QPM problem; accurate phase recovery; bandlimited phase objects; continuous-domain object; exact phase reconstruction; interfering reference wave; large excursions; noiseless phase reconstruction technique; noniterative phase reconstruction technique; quantitative phase microscopy; synthesized phase objects; zero-order artifact; Fourier transforms; Holography; Image reconstruction; Microscopy; Optimized production technology; Phase measurement; Phase retrieval; homomorphic deconvolution; phase unwrapping; quantitative phase microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2014 IEEE International Conference on
  • Conference_Location
    Paris
  • Type

    conf

  • DOI
    10.1109/ICIP.2014.7025799
  • Filename
    7025799