• DocumentCode
    2491749
  • Title

    Performance of an optoelectronic expert system for massively parallel knowledge base applications

  • Author

    Ghoniemy, Samy ; Karam, Omar H.

  • Author_Institution
    Electr. Eng. Branch, MTC, Cairo, Egypt
  • fYear
    2010
  • fDate
    15-18 Dec. 2010
  • Firstpage
    108
  • Lastpage
    113
  • Abstract
    In this paper a mapped-template logic-based parallel optoelectronic processor is proposed for expert systems in order to achieve high speed and high performance for massively parallel processing of rule-based systems. The proposed system is implemented using two-dimensional space optics symbolic correlator. Also in this paper, an optoelectronic system for a parallel inference engine is presented. The proposed optical inference engine infers conclusions to queries by representing knowledge (facts and rules) in 2D space using a matrix-like formulation. Performance evaluation algorithms for both search and reasoning are presented. Performance enhancement technique is also discussed in this paper. The performance analysis of the proposed system shows its remarkably improved performance compared with multiprocessor electronic systems using conventional programming.
  • Keywords
    expert systems; inference mechanisms; knowledge based systems; knowledge representation; matrix algebra; parallel processing; performance evaluation; conventional programming; knowledge representation; mapped template logic; matrix formulation; multiprocessor electronic system; optical inference engine; optoelectronic expert system; parallel inference engine; parallel knowledge base application; parallel optoelectronic processor; performance evaluation algorithm; rule based system; two dimensional space optics symbolic correlator; Arrays; Frequency modulation; Massively parallel optical processssing; Optical knowledge base; Opto-Electronic Expert system;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing and Information Technology (ISSPIT), 2010 IEEE International Symposium on
  • Conference_Location
    Luxor
  • Print_ISBN
    978-1-4244-9992-2
  • Type

    conf

  • DOI
    10.1109/ISSPIT.2010.5711739
  • Filename
    5711739